This article will present the mlreflect package, written in Python, which is an optimized data pipeline for automated analysis of reflectometry data using machine learning. This package combines several methods of training and data processing. The predictions made by the neural network are accurate and reliable enough to serve as good starting parameters for subsequent data fitting using the least-mean-squares (LSC) method. For a large dataset consisting of 250 reflectivity curves of various thin films on silicon substrates, it was demonstrated that the analytical data pipeline with high accuracy finds the minimum of the film, which is very close to the set by the researcher using physical knowledge and carefully selected boundary conditions.

Keywords: neural network, radiography, thin films, data pipeline, machine learning