The paper reveals data on the development of simulation models of integrated circuit pulse voltage converters for applying in automated measuring equipment used in the tests of integrated circuits. The integrated circuit of switching voltage converter LM2676 was simulated taking into account heat generation and taking into account the mutual influence of crystal temperature on external electrical characteristics as part of a general behavioral model.The authors obtained results and dependences, coinciding with the experimental data and with the SPICE model at the transistor level, that reflects the influence of the crystal temperature on the the chip operation. In addition, the authors consider a possibility of using behavioral models as a source of reference information in the process of testing electronic components.

Keywords: ATE, integrated circuit (IC) testing, switching voltage converters, behavioral model, VHDL-AMS